September 9, 2021
The CIF recently acquired a JEOL scanning electron microscope (SEM) for materials analysis and imaging. This SEM has ~10 nm resolution as well as X-ray elemental dispersion spectroscopy (EDS), and can operate in high vacuum and low vacuum modes. The instrument is straightforward to use since all components are operable from one software package, and it is located in 1710 Gilman Hall. Please inquire to Brett regarding sample submission or training requests. More details on the instrument are available on the JEOL JSM-IT200 Scanning Electron Microscope page.